Application Trend

Custom Analysis:

• 1st Dimension – Application Date/Issue Date
• 1st Indicator – Patent Count

Issued Trend

Custom Analysis:

• 1st Dimension – Application Date
• 1st Indicator – Patent Count
• 2nd Indicator – Grant Rate

✔️

Simple Legal Status

• 1st Dimension – Simple Legal Status
• 1st Indicator – Patent Count

✔️

Patent Type

• 1st Dimension – Patent Type
• 1st Indicator – Patent Count

Patent Filing Trends - Analyze the number of patent filings over time. A rising number indicates growth, while declining filings suggest maturity or decline.

Custom Analysis:

• 1st Dimension – Application Date
• 1st Indicator – Patent Count

Apply filter for relevant technology codes (IPC, CPC) to focus the analysis. 

Applicant Analysis: A sharp upwards trend of patent applicants indicates rapid growth or a clear downwards trend shows a shrinking interest in the technology.

Custom Analysis:

• 1st Dimension – Application Date
• 2nd Dimension – Std. Current Assignee 
• 1st Indicator – Patent Count

• 1st Dimension – Earliest Priority Country
• 1st Indicator – Patent Count

Custom Analysis:

• 1st Dimension – Application Date
• 2nd Dimension – Earliest Priority Country
• 1st Indicator – Patent Count

Tip: adjust content display to include legend.

✔️

Top Authorities

• 1st Dimension – Authority
• 1st Indicator – Patent Count

Custom Analysis:

• 1st Dimension – Application Date
• 2nd Dimension - Authority
• 1st Indicator – Patent Count

Tip: adjust content display to include legend. 

Run search with IP5 search scope: US, CN, EP, JP, KR

Custom Analysis:

• 1st Dimension – Priority Country/Region
• 2nd Dimension - Authority
• 1st Indicator – Patent Count

Tip: you can remove any priority countries that are not IP5 from the x-axis by clicking the three-dot icon next to the dimension field, going into the analysis range settings, then clicking on the ‘customized sorting’ tab and unticking the boxes of any countries you do not want displayed.  

✔️

Top Province

• 1st Dimension – Current Assignee State/Province
• 1st Indicator – Patent Count 

✔️

Application Trend of Provinces

• 1st Dimension – Application Date
• 2nd Dimension – Current Assignee State/Province
• 1st Indicator – Patent Count

✔️

Top IPC

Custom Analysis:

• 1st Dimension – IPC
• 1st Indicator – Patent Count

Tip: similar to editing the technology display settings in Insights, you can adjust the dimension in Custom Analysis to analyze CPC, Application Domain, Technology Topic, or Custom Fields. Levels of the fields (e.g. IPC level) can also be adjusted.

✔️

Application Trend of IPC

• 1st Dimension – Application Date
• 2nd Dimension – IPC
• 1st Indicator – Patent Count

• 1st Dimension – IPC
• 2nd Dimension – Authority
• 1st Indicator – Patent Count

• 1st Dimension – IPC
• 2nd Dimension – Std. Current Assignee
• 1st Indicator – Patent Count

✔️

Top Standardized Current Assignees, and Top Current Assignees

• 1st Dimension – Std. Current Assignee
• 1st Indicator – Patent Count

Run a technology search. Then, from the search results page, refine results by the top 10 assignees.

Custom Analysis:

• 1st Dimension – Application Date
• 2nd Dimension – Std. Current Assignee
• 1st Indicator – Patent Count

Tip: use the stacked column chart or bubble chart to improve chart visual.

Run a technology search. Then, from the search results page, use Advanced Refinement to refine results using the ‘Patents with licensing information’ field and input ‘1’.

Custom Analysis:

• 1st Dimension – Std. Current Assignee
• 2nd Dimension – Licensee OR Licensor
• 1st Indicator – Patent Count

✔️

IPC Distribution of Standardized Current Assignees

Custom Analysis:

• 1st Dimension – Std. Current Assignee
• 2nd Dimension – IPC
• 1st Indicator – Patent Count

✔️

Application Trend of Standardized Current Assignees

Custom Analysis:

• 1st Dimension – Application Date
• 2nd Dimension – Std. Current Assignee
• 1st Indicator – Patent Count

✔️

Patent Distribution of Standardized Current Assignees

Custom Analysis:

• 1st Dimension – Authority
• 2nd Dimension – Std. Current Assignee
• 1st Indicator – Patent Count

This patent heat map highlights the concentration of patent activity across various technology fields and companies, allowing for quick identification of industry leaders, areas of specialization, and competitive landscapes. It reveals which companies dominate specific technologies, while also helping assess market competition and potential growth areas in emerging technologies.

Custom Analysis:

• 1st Dimension – Std. Current Assignee
• 2nd Dimension – Technology Topic (2nd level)
• 1st Indicator – Patent Count

✔️

Top Inventors

Custom Analysis:

• 1st Dimension – Inventor Name
• 1st Indicator – Patent Count

✔️

✔️

Application Trend of Inventor

Custom Analysis:

• 1st Dimension – Application Date
• 2nd Dimension – Inventor Name
• 1st Indicator – Patent Count

This chart can be used to spot inventors who consistently collaborate, identify leading talent, and find established teams that may be ideal for recruitment or partnerships. It also helps recognize patterns of innovation across individuals, making it easier to explore collaboration or synergy opportunities within the technology space.

Run a technology search. From the result page, use Advanced Refinement to refine results using the 'Count of Inventors' field and input equal or more than '2'.

Custom Analysis:

• 1st Dimension – Inventor Name
• 2nd Dimension – Inventor Name
• 1st Indicator – Patent Count

Run a technology search. From the result page, sort results by 'Cited By Count'. Display 'Cited By Count' field and view the number for the top result. Add CITEDBY_COUNT:[x TO x] and input the appropriate numbers. 

Custom Analysis:

• 1st Dimension – Publication Number
• 1st Indicator – Cited By Count

Run a technology search. From the result page, sort results by 'Patsnap Family Application Count'. Display 'Patsnap Family Application Count'  field and view the number for the top result. Add EFAM_COUNT:[x TO x] and input appropriate numbers. 

Custom Analysis:

• 1st Dimension – Publication Number
• 2nd Dimension – Patsnap Family Application Count
• 1st Indicator – Patent Count

Run a technology search. From the result page, sort results by 'Claim Count'. Display 'Claim Count’ field and view the number for the top result. Add CLAIM_COUNT:[x TO x] and input appropriate numbers.

Custom Analysis:

• 1st Dimension – Publication Number
• 1st Indicator – Claim Count

No workaround available.

To view records with litigation data in the technology space, run a technology search, then on the search results page, use Advanced Refinement. Select the field, ‘Patents with litigation information’, and enter ‘1’ in the field to refine.

To understand the total value of patents across the technology space, create the following custom analysis chart and combine the total value of each column.

Custom Analysis:

• 1st Dimension – Patent Value(USD)
• 1st Indicator – Patent Value(USD)

• 1st Dimension – Patent Value(USD)
• 1st Indicator – Patent Count

No workaround available in Analytics.

The following chart provides patent value distribution across various IPCs, indicating the potential innovation hotspots and areas of significant investment.

Custom Analysis:

• 1st Dimension – IPC
• 1st Indicator – Patent Value(USD)

• 1st Dimension – Publication Date
• 2nd Dimension – License Count
• 1st Indicator – Patent Count

Total Cases: 

• Use litigation view search (in legal search) and view the total number of cases in the results page. 

Patents Involved: 

• Use patent view search (in litigation search, under legal search) and view the total number of patents in the results page.

Custom Analysis:

• 1st Dimension – Litigation Count
• 2nd Dimension – IPC/Technology Topic (1st/2nd/3rd levels)
• 1st Indicator – Patent Count

Tip: use the heat map chart display.

Complete workaround not available.

Custom Analysis:

• 1st Dimension – Publication Date
• 2nd Dimension – Litigation Count
• 1st Indicator – Patent Count

Custom Analysis:

• 1st Dimension – Plaintiff Name
• 2nd Dimension – Litigation Count
• 1st Indicator – Patent Count

Tip: use the stacked column chart display.

Custom Analysis:

• 1st Dimension – Technology Topic
• 1st Indicator – Patent Count

Tip: use the word cloud chart display.

Custom Analysis:

• 1st Dimension – Technology Topic (1st/2nd/3rd levels)
• 1st Indicator – Patent Count

Tip: use the circle or pie chart display.